Marker Design

References

Marker design

for nanometre-precise referencing of topography measurement data

lens design

test object

probing a marker

Probing a marker at the lens

Exposed marker with defect

Probing a diagonal marker

Marker design for nanometer-accurate positioning - Marker development for the position referencing of topography measurement data, which should be visible and measurable for different measuring systems (data fusion)

conception
manufacturing
measurement and evaluation

publications:

Müller, A., Mastylo, R., Vorbringer-Dorozhovets, N., Manske, E.: Markers for referencing topography measurement data of optical surfaces.; 58th IWK, Ilmenau Scientific Colloquium, Technische Universität Ilmenau, 8 - 12 September 2014

Blobel, G.; Wiegmann, A.; Quabis, S.; Schulz, M.; Müller, A.; Manske, E.: "Entwicklung von Normalen für die Charakterisierung von Asphären-Messgeräten." - In: DGaO-Proceedings. - Erlangen-Nürnberg: Dt. Gesellschaft für angewandte Optik, ISSN 16148436, Bd. 115.2014, A31, insges. 2 S.