Marker design

for referencing topography measurement data

    Marker design for nanometer-accurate positioning - Marker development for the position referencing of topography measurement data, which should be visible and measurable for different measuring systems (data fusion)

    • conception
    • manufacturing
    • measurement and evaluation

    publications:

    Müller, A., Mastylo, R., Vorbringer-Dorozhovets, N., Manske, E.: Markers for referencing topography measurement data of optical surfaces.; 58th IWK, Ilmenau Scientific Colloquium, Technische Universität Ilmenau, 8 - 12 September 2014

    Blobel, G.; Wiegmann, A.; Quabis, S.; Schulz, M.; Müller, A.; Manske, E.: "Entwicklung von Normalen für die Charakterisierung von Asphären-Messgeräten." - In: DGaO-Proceedings. - Erlangen-Nürnberg: Dt. Gesellschaft für angewandte Optik, ISSN 16148436, Bd. 115.2014, A31, insges. 2 S.